タイトルUniversal quantum gate fidelity exceeding the fault-tolerance threshold in silicon
発表者Akito Noiri¹,Kenta Takeda¹,Takashi Nakajima¹,Takashi Kobayashi², Amir Sammak³,Giordano Scappucci⁴, and Seigo Tarucha¹,²
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1 Center for Emergent Matter Science (CEMS), RIKEN, Wako, Saitama, Japan.
2 Center for Quantum Computing (RQC), RIKEN, Wako, Saitama, Japan
3 QuTech and Netherlands Organization for Applied Scientific Research (TNO), Delft, Netherlands
4 QuTech and Kavli Institute of Nanoscience, Delft University of Technology, Delft, Netherlands
日時2021年10月25日(月)~31日(日)

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