タイトル | Universal quantum gate fidelity exceeding the fault-tolerance threshold in silicon | |
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発表者 | Akito Noiri¹,Kenta Takeda¹,Takashi Nakajima¹,Takashi Kobayashi², Amir Sammak³,Giordano Scappucci⁴, and Seigo Tarucha¹,² -- 1 Center for Emergent Matter Science (CEMS), RIKEN, Wako, Saitama, Japan. 2 Center for Quantum Computing (RQC), RIKEN, Wako, Saitama, Japan 3 QuTech and Netherlands Organization for Applied Scientific Research (TNO), Delft, Netherlands 4 QuTech and Kavli Institute of Nanoscience, Delft University of Technology, Delft, Netherlands | |
日時 | 2021年10月25日(月)~31日(日) |