| 掲載誌 | Scientific Reports |
| タイトル | 4.2K Sensitivity-Tunable Radio Frequency Reflectometry of a Physically Defined p-channel Silicon Quantum Dot |
| 著者 | Sinan Bugu, Shimpei Nishiyama¹, Kimihiko Kato², Yongxun Liu², Shigenori Murakami², Takahiro Mori², Thierry Ferrus³, and Tetsuo Kodera¹ — 1 Tokyo Institute of Technology 2 Device Technology Research Institute (D-Tech), National Institute of Advanced Industrial Science and Technology (AIST) 3 Hitachi Cambridge Laboratory |
| 備考 | 4.2 K sensitivity-tunable radio frequency reflectometry of a physically defined p-channel silicon quantum dot | Scientific Reports |
