Fast universal quantum gate above the fault-tolerance threshold in silicon
Akito Noiri, Kenta Takeda, Takashi Nakajima, Takashi Kobayashi, Amir Sammak, Giordano Scappucci & Seigo Tarucha
Nature volume 601, pages338–342 (2022)

タイトル	Fast universal quantum gate above the fault-tolerance threshold in silicon
著者	Akito Noiri¹, Kenta Takeda¹, Takashi Nakajima¹, Takashi Kobayashi², Amir Sammak³, Giordano Scappucci⁴, and Seigo Tarucha¹,² -- 1 Center for Emergent Matter Science (CEMS), RIKEN, Wako, Saitama, Japan. 2 Center for Quantum Computing (RQC), RIKEN, Wako, Saitama, Japan 3 QuTech and Netherlands Organization for Applied Scientific Research (TNO), Delft, Netherlands 4 QuTech and Kavli Institute of Nanoscience, Delft University of Technology, Delft, Netherlands

タイトル

Fast universal quantum gate above the fault-tolerance threshold in silicon

著者

Akito Noiri¹, Kenta Takeda¹, Takashi Nakajima¹, Takashi Kobayashi², Amir Sammak³, Giordano
Scappucci⁴, and Seigo Tarucha¹,²
--
1 Center for Emergent Matter Science (CEMS), RIKEN, Wako, Saitama, Japan.
2 Center for Quantum Computing (RQC), RIKEN, Wako, Saitama, Japan
3 QuTech and Netherlands Organization for Applied Scientific Research (TNO), Delft, Netherlands
4 QuTech and Kavli Institute of Nanoscience, Delft University of Technology, Delft, Netherlands