| Title | “Fast universal quantum gate above the fault-tolerance threshold in silicon” ＜Nature volume 601, pages338–342 (2022)＞ |
| Authors | Akito Noiri¹, Kenta Takeda¹, Takashi Nakajima¹, Takashi Kobayashi², Amir Sammak³, Giordano Scappucci⁴, and Seigo Tarucha¹,² — 1 Center for Emergent Matter Science (CEMS), RIKEN, Wako, Saitama, Japan. 2 Center for Quantum Computing (RQC), RIKEN, Wako, Saitama, Japan 3 QuTech and Netherlands Organization for Applied Scientific Research (TNO), Delft, Netherlands 4 QuTech and Kavli Institute of Nanoscience, Delft University of Technology, Delft, Netherlands |
| Date | January.19ˢᵗ 2022 |
Fast universal quantum gate above the fault-tolerance threshold in silicon – Nature
Single- and two-qubit gate fidelities above the fault-tolerance threshold for quantum computation are demonstrated in silicon quantum dots by fast electrical control using a micromagnet-induced gradient field and tunable coupling.
www.nature.com
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